The MAX9965/MAX9966 four-channel, low-power, high-speed
pin electronics driver and comparator ICs
include for each channel a three-level pin driver, comparator,
and variable clamps. The MAX9965/MAX9966
are similar to the MAX9963/MAX9964, but with even
lower window comparator dispersion for enhanced
accuracy. The driver features a wide voltage range and
high-speed operation, includes high-Z and active termination
(3rd-level drive) modes, and is highly linear even
at low-voltage swings. The dual bipolar-input comparator
provides very low dispersion (timing variation) over a
wide variety of input conditions. The clamps provide
damping of high-speed DUT waveforms when the
device is configured as a high-impedance receiver.
High-speed, differential control inputs compatible with
ECL, LVPECL, LVDS, and GTL levels are provided for
each channel. ECL/LVPECL or flexible open-collector
outputs are available for the comparators.
The A-grade version provides tight matching of gain
and offset for the driver and comparator, allowing reference
levels to be shared across multiple channels in
cost-sensitive systems. For system designs that incorporate
independent reference levels for each channel,
the B-grade version is available at reduced cost.
Optional internal resistors at the high-speed inputs provide
differential termination of LVDS inputs, while
optional internal resistors provide the pullup voltage
and source termination for open-collector comparator
outputs. These features significantly reduce the discrete
component count on the circuit board.
The MAX9965/MAX9966 operating range is -1.5V to
+6.5V, with power dissipation of only 975mW per channel.
These devices are available in a 100-pin, 14mm x
14mm body, 0.5mm pitch TQFP with an exposed 8mm
x 8mm die pad on the top (MAX9965) or bottom
(MAX9966) of the package for efficient heat removal.
The MAX9965/MAX9966 are specified to operate with
an internal die temperature of +60°C to +100°C, and
feature a die temperature monitor output.
Applications
- Low-Cost Mixed-Signal/System-on-Chip Testers
- Memory Testers
- Pattern/Data Generators
- Structural Testers
